Radiation Testing and Effects On Small Satellites

Radiation Testing and Effects On Small Satellites

Opening Insights

Radiation is one of the most persistent and potentially destructive forces affecting spacecraft in orbit. From single-event upsets (SEUs) to long-term degradation of semiconductor devices, ionizing radiation poses a direct threat to satellite reliability, particularly for small satellites using commercial off-the-shelf (COTS) components. As CubeSats and microsatellites take on longer-duration and higher-risk missions, the importance of robust radiation testing and mitigation strategies has grown significantly.

Unlike large spacecraft with room for redundancy and shielding, smallsats must strike a careful balance between performance, cost, mass, and survivability. This makes radiation testing—not just analysis—a key part of any serious small satellite development effort.

The Radiation Environment in Orbit

Satellites in Low Earth Orbit (LEO) and beyond are exposed to multiple sources of radiation:

  • Trapped particles in the Van Allen belts (primarily protons and electrons)
  • Solar particle events (SPEs)—sudden bursts of high-energy protons from solar flares
  • Galactic cosmic rays (GCRs)—high-energy ions originating from outside the solar system

LEO missions below 1,000 km generally encounter fewer GCRs but still face significant exposure during South Atlantic Anomaly (SAA) transits and occasional solar storms. Higher orbits, including Medium Earth Orbit (MEO) and Geostationary Orbit (GEO), see sustained radiation flux and demand more aggressive design protections.

Why Radiation Testing Matters for Smallsats

Radiation effects on electronic systems fall into two main categories:

  • Cumulative effects such as Total Ionizing Dose (TID) and Displacement Damage (DD), which degrade semiconductor performance over time
  • Single-event effects (SEEs) including SEUs, latchups, burnouts, and gate ruptures—caused by a single particle striking a sensitive region in a device

Smallsats using COTS components are particularly vulnerable to SEEs due to their minimal shielding and lack of radiation-hard design. In many cases, a single high-energy particle can cause data corruption, a logic fault, or even permanent damage to a microcontroller or memory chip.

According to Sinclair and Dyer (2013), more than 40% of COTS-based CubeSat missions have experienced in-orbit anomalies potentially linked to radiation effects. The risk is especially high for missions operating in polar orbits, passing through the SAA, or relying on SRAM, FPGAs, or flash memory.

Radiation Testing Approaches

To mitigate these risks, smallsat teams use a combination of:

  • Ground-based radiation testing of critical components and systems
  • Model-based dose analysis to predict mission exposure based on orbital parameters
  • System-level fault tolerance through software and hardware redundancy

Radiation testing facilities simulate the space environment using particle accelerators or radioactive sources. These can expose components to proton, heavy ion, or gamma radiation to evaluate susceptibility to SEEs and total dose degradation.

In a foundational study, Pease et al. (1988) outlined the methodology for radiation testing of semiconductors. They emphasized the need for both component-level SEE testing (e.g. latchup threshold, upset cross-section) and total dose evaluation over extended durations. Their work has shaped decades of testing standards still in use today.

System-Level Testing and Risk Acceptance

More recently, Coronetti et al. (2021) emphasized the importance of system-level radiation testing—not just isolated component screening. Their methodology integrates hardware exposure, software recovery logic, and real-time fault tracking to assess end-to-end mission robustness.

This approach is especially important for smallsat teams using partially qualified or COTS subsystems. Rather than assuming component-level performance guarantees, system-level testing validates the spacecraft’s actual behavior under radiation stress—including fault handling, reset procedures, and data retention.

The paper also addressed a recurring issue in smallsat development: risk acceptance. Many programs accept limited degradation or transient faults as part of the operational model. By testing entire systems instead of just parts, teams can quantify this risk and make informed trade-offs.

Mitigation Strategies for COTS-Based Missions

Radiation-hardened (rad-hard) parts are often unavailable or unaffordable for smallsat missions. As a result, most programs rely on a combination of:

  • Shielding: Passive protection using aluminum or specialized materials to reduce dose rates
  • Software error correction: Including watchdog timers, memory scrubbing, and triple modular redundancy (TMR) in logic circuits
  • Component derating: Operating electronics below maximum voltage/current limits to improve tolerance
  • Selective part qualification: Testing only the most sensitive or mission-critical components

Nikicio et al. (2017) proposed a practical framework for LEO CubeSat developers that combines Monte Carlo radiation analysis with fault injection simulations. Their model evaluates the probability of mission failure based on orbital environment, shielding configuration, and onboard error detection capabilities. This type of modeling helps prioritize which components require testing or design hardening.

Common Devices Under Test

The most frequently tested components in smallsat radiation campaigns include:

  • Microcontrollers and processors (e.g. ARM Cortex, Microchip, Atmel, TI MSP430)
  • FPGAs (especially SRAM-based)
  • Flash and EEPROM memory
  • Voltage regulators and power controllers
  • ADCS sensors (magnetometers, sun sensors)

Testing often focuses on threshold LET (Linear Energy Transfer) values for SEEs and degradation curves for TID exposure. Components that pass screening are often “lot-qualified”—meaning that only the tested production batch is verified for flight.

In some cases, multiple parts of the same type are tested to account for batch-to-batch variation. Modern test campaigns increasingly emphasize mixed-signal devices and system-on-chip (SoC) architectures, which combine logic, memory, and analog functions into a single package—raising the complexity of fault analysis.

Testing Facilities and Standards

Radiation test campaigns typically use one or more of the following facilities:

  • Proton accelerators for SEE characterization
  • Heavy ion beams to simulate cosmic ray effects
  • Gamma cell or Co-60 sources for total dose testing
  • X-ray machines for fast dose delivery in TID testing

Standards such as JEDEC JESD89A, MIL-STD-883, and ECSS-Q-ST-60-15C define test protocols, dosimetry, and reporting requirements.

As Coronetti et al. note, system-level testing requires special facilities with shielding, telemetry monitoring, and in-situ control to evaluate software behavior and fault recovery during exposure. These setups are less common but increasingly vital as mission complexity rises.

Moving Toward Resilience, Not Perfection

Radiation testing for smallsats isn’t about achieving zero faults—it’s about building a spacecraft that can tolerate the faults that occur. Many modern CubeSat missions embrace fault-tolerant architecture, using error-correcting memory, watchdog timers, and autonomous recovery routines to survive transient events.

The focus is shifting from pure component screening to full-stack resilience: “How does the system behave when something goes wrong?” This philosophy supports greater design flexibility and faster innovation while managing real-world risks.

Radiation-aware design doesn’t eliminate failure—it gives teams a plan for when (not if) the unexpected occurs.

Conclusion

Radiation effects remain one of the most unpredictable and potentially mission-ending threats in spaceflight—especially for small satellites relying on commercial electronics. By integrating radiation testing into the development lifecycle, smallsat teams can understand their system’s limits, build in resilience, and make informed risk decisions.

From SEE testing of microcontrollers to full-system irradiation campaigns, modern testing strategies balance budget, complexity, and mission needs. As small satellites expand into higher orbits, longer missions, and more critical applications, radiation testing is becoming a foundational part of mission assurance.

Explore More

Explore radiation testing services, shielding solutions, and fault-tolerant avionics in the Engineering and Testing Services, and Flight Hardware categories of the SmallSat Catalog. The SmallSat Catalog is a curated digital portal for the small satellite industry, featuring components, test providers, and technical services to help you navigate space’s toughest conditions.

Recommended Reading:

  • Pease, R. et al. (1988). Radiation Testing of Semiconductor Devices for Space Electronics.” Proceedings of the IEEE, 76(11), 1510-1526.
  • Coronetti, A. et al. (2021). Radiation Hardness Assurance Through System-Level Testing. IEEE transactions on nuclear science, 68(5), 958-969.
  • Sinclair, D. & Dyer, J. (2013). Radiation Effects and COTS Parts in SmallSats.
  • Nikicio, A. et al. (2017). Radiation Analysis and Mitigation Framework for LEO Small Satellites. In 2017 IEEE International Conference on Communication, Networks and Satellite (Comnetsat) (pp. 59-66). IEEE.